Nokia Customer Care
Memory troubleshooting
Most memory related errors are found through flashing the device; flashing the device is
therefore recommended before any of the steps described in this chapter. Check flashing
troubleshooting section first!
There are however a few memory related errors that cannot be found through flashing.
• SDRAM(D310) partially damaged. This can mean that the SDRAM component
itself is partially damaged and all the memory locations cannot be successfully
read or there is a soldering problem somewhere either under UPP or SDRAM.
There is a BB self-test for testing SDRAM component quite thoroughly, but the
problem is that if SDRAM does not function properly one may not be able to run
those tests as SDRAM is used during the device boot and self-test cannot be run
if the device has not booted.
• DEVICE may inform about being "out of memory " more often than it should
• Flash1 (D312) is partially/totally damaged. During flashing the manufacturer,
device and revision IDs are read, but flashing is done based on IDs of the flash0
(D311). This means that one cannot see any error messages displayed on the
Phoenix window during flashing, if flash1 is failing. IDs are however displayed on
the Phoenix window and successful read of flash1 IDs can be checked from there.
Serial interface troubleshooting
CBUS
CBUS is a three wire serial interface between the main baseband components. The bus
consists of data, clock and bus_enable signals. In RH-47, the bus is connected from UPP
WD2 to ZOCUS, UEM and LPRF. UPP_WD2 takes care of controlling the traffic on the bus.
If the interface is faulty from the UPP WD2's end, the phone will not boot properly as
powering configurations do not work. Traffic on the bus can be monitored from three
pins on the BT module: pins 34, 35 and 36.
If however you are able to get the phone to boot up and can reach Phoenix BB self-tests
it is possible to test the functionality of each component attached to Cbus.
Use:
ST_ZOCUS_CBUS_IF_TEST to test AEM Cbus interface
ST_UEM_CBUS_IF_TEST to test UEM Cbus interface
ST_LPRF_IF_TEST to test Bluetooth Cbus interface
If an error is found testing any of the above components, you should replace the failing
component.
Issue 1 05/04
Company Confidential
6 - Baseband Description and Troubleshooting
Copyright © 2004 Nokia Corporation
Company Confidential
RH-47
Page 51